Failure mechanisms in blue InGaN/GaN LEDs for high power operation
نویسندگان
چکیده
0026-2714/$ see front matter 2012 Elsevier Ltd. A http://dx.doi.org/10.1016/j.microrel.2012.06.051 ⇑ Corresponding author. Tel.: +7 812 247 91 93; fax E-mail address: [email protected] (E.I. Shabunina). Unpredictable fast failure of blue power InGaN/GaN LEDs is caused by redistribution of In under action of injection currents between nano-scale regions of InGaN alloy with non-equilibrium composition. Unreliable LEDs can be recognized by the increase in forward current values at U < 2 V which is not accompanied by simultaneous reversed current increase during short aging tests (less than 100 h). 2012 Elsevier Ltd. All rights reserved.
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ورودعنوان ژورنال:
- Microelectronics Reliability
دوره 52 شماره
صفحات -
تاریخ انتشار 2012